The power consumed, and the subsequent heat release, increase despite the reduction in the size of the transistors. High levels of energy reduce the reliability of chips and their life expectancy, and create the need for more frequent charging on mobile devices.
Modern processors face reliability problems during their lifetime due to errors resulting from cosmic radiation and electrically charged particles, the aging and wear of the circuits over time, and manufacturing defects.
This research by the Computer Architecture Laboratory has been carried out in the framework of the research project FP7 Clereco, in which the National and Kapodistrian University of Athens participated as a partner.
Researchers: Dr. G. Papadimitriou, Dr. A. Chatzidimitriou, Prof. D. Gizopoulos